The average number ofįaults detected by configurable 2-D LFSR is 9.27% higher Show with the configurable scheme the number of flip-flops The configurable 2-D LFSR test generator can beĪdopted in two basic BIST execution options: test-per-clock (parallel BIST) and test-per-scan (serial BIST).Įxperimen-tal results of test-per-clock BIST for benchmark circuits Sequence of test patterns for random-pattern-resistant faults, and then 2) random patterns for random-pattern-detectableįaults. This configurable 2-D LFSRīased test pattern generator generates: 1) a deterministic Two-dimensional (2-D) linear feedback shift registers (LFSR) forīoth embedded and random test pattern generation in built-in Wright State University Dayton, Ohio 45435, USA AbstractĪ new approach to optimize a configurable Automated Synthesis of Configurable Two-dimensional Linear Feedback Shifter Registers for Random/Embedded Test PatternsĬhien-In Henry Chen and Kiran George Department of Electrical Engineering
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